Detaljeret beskrivelse

High resolution investigations of hot-electron devices 

Contacts:

Robert Jensen, CINF, DTU Physics, PhD student (Robert.jensen@fysik.dtu.dk)
Ib Chorkendorff, CINF, DTU Physics, 4525-3170 (ibchork@fysik.dtu.dk)

 

 

SPM

Using a high-resolution XYZ-scanner, you will do investigations of the surface of Hot-Electron emitters. Theses investigations can regard properties such as the electrical conductance of the metal film, the temperature, or measurements of the emitted electrons. Possibly we will also look in to using the scanner to modify the surface in an attempt to optimize the device for electron emission.