Supervisor
Christian Danvad Damsgaard
Department of Physics and Center for Electron Nanoscopy
christian.damsgaard@cen.dtu.dk, 45256487
Investigation of heterogenous catalysts during catalyst synthesis and product formation
In situ x-ray diffractometry (in situ XRD) makes it possible to study heterogenous catalysts during catalyst synthesis and product formation. The technique is able to probe "global" (average) sample properties such as crystal structure, phase purity and crystallite size while analyzing the process gas during the reaction. This offers a unique opportunity to follow the catalyst morphology and activity during operation.
The in situ XRD data will be compared to complimentary techniques such as DTU Cens environmental transition electron microscope (ETEM), which probes complementary information on the atomic scale.
DTU Physics and DTU Cen
